Secondary Ion Mass Spectrometry

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Electron and Ion Beam Characterization (Coursera)

Apr 29th 2024
Electron and Ion Beam Characterization (Coursera)
Course Auditing
Coursera
Arizona State University
Categories
Engineering
Effort
Intermediate
5-12 Weeks
1-4 Hours/Week
Languages
English
English
Electron and Ion Beam Characterization (Coursera)
Electron and ion beams are widely used for both qualitative and quantitative analysis of semiconductor materials and devices. They can be used to image structures with sub-nm resolution and to provide information about elemental composition and dopant concentration. This course describes the fundamentals of electron and ion beam characterization [...]
Semiconductor Characterization Specialization
Electrons
Ion Beam
Semiconductors
Semiconductor Materials
Spectroscopy
Scanning Electron Microscopy
Auger Electron Spectroscopy
Secondary Ion Mass Spectrometry
Coursera Plus
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Apr 29th 2024
Course Auditing
Coursera
Arizona State University
Engineering
Intermediate
5-12 Weeks
1-4 Hours/Week
45.00 EUR/month
English
English

Methods of Surface Analysis (Coursera)

Jul 18th 2022
Methods of Surface Analysis (Coursera)
Course Auditing
Coursera
National Research Nuclear University MEPhI
Categories
Science
Engineering
Effort
Intermediate
5-12 Weeks
5-10 Hours/Week
Languages
English
French
Portuguese
Russian
English
Spanish
Methods of Surface Analysis (Coursera)
There is a vast variety of contemporary surface analysis methods that you can use for your research. If you are not sure which one is right for you, or if you want to obtain the right information about different surface analysis techniques, then this course is for you!
Surface Analysis
Secondary Ion Mass Spectrometry
SIMS
Rutherford Backscattering
Spectroscopy
Research Methods
Microscopy
X-Rays
Coursera Plus
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Jul 18th 2022
Course Auditing
Coursera
National Research Nuclear University MEPhI
Science
Engineering
Intermediate
5-12 Weeks
5-10 Hours/Week
41.00 EUR
English
French
Portuguese
Russian
English
Spanish

Surface Science: Methods of Surface Analysis (edX)

Self Paced
Surface Science: Methods of Surface Analysis (edX)
Course Auditing
EdX
National Research Nuclear University MEPhI
MEPhIx
Categories
Engineering
Sci: Physics
Effort
Intermediate
Self-Paced
1-4 Hours/Week
Languages
English
English
Surface Science: Methods of Surface Analysis (edX)
Discover contemporary surface analysis techniques and learn how to choose the right method for your research. There is a vast variety of contemporary surface analysis methods that you can use for your research. If you are not sure which one is right for you, or if you want to [...]
Physics
Surface
Surface Analysis
Surface Science
X-Rays
SIMS
Rutherford Backscattering
XPS
X–Ray Photo–Electron Spectroscopy
Probe Microscopes
Secondary Ion Mass Spectrometry
View more details
Self Paced
Course Auditing
EdX
National Research Nuclear University MEPhI
MEPhIx
Engineering
Sci: Physics
Intermediate
Self-Paced
1-4 Hours/Week
43.00 EUR
English
English