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The obtained knowledge will serve as basics for future practical usage of electron and ion microscopy as well as focused ion beam systems in various fields from basic research to industrial applications. A distinguished feature of the course is the consideration of both electron and ion beam technologies, which started to be rapidly growing due to the availability of recently industrially developed dual beam equipment, where these technologies are used jointly.
Syllabus
WEEK 1: General Topics in Electron and Ion Microscopy
WEEK 2: Scanning Electron Microscopy
WEEK 3: Transmission Electron Microscopy
WEEK 4: Scanning Ion Microscopy and Focused Ion Beams
WEEK 5: Analysis in Electron Microscopy
MOOC List is learner-supported. When you buy through links on our site, we may earn an affiliate commission.
MOOC List is learner-supported. When you buy through links on our site, we may earn an affiliate commission.